The Johns Hopkins University

Whiting School of Engineering

Department of Electrical and Computer Engineering

Compressive and thin imaging

Seminar By

David J. Brady

Electrical and Computer Engineering

Duke University

Abstract:

Generalized sampling uses anisomorphic measurement to improve metrics of nominally isomorphic sensor systems (e.g. imagers). Generalized sampling enables one to estimate more pixels than one measures (e.g. a 1 Mpixel focal plane might reconstruct 10 Mpixel images), to capture specific object features without measuring every pixel and to transform the physical and logical structure of sensor systems. This talk reviews generalized sampling strategies in sensors constructed by the Duke Imaging and Spectroscopy Program (www.disp.duke.edu) over the past several years.

Thursday, October 18, 2007

4:00 P.M.

Barton 117

Refreshments will be served at 3:45 p.m.

FOR DISABILITY INFORMATION

CONTACT: Candace Abel (410) 516-7031 cabel@jhu.edu